| View Larger Image | Advanced Scanning Electron Microscopy and X-Ray Microanalysis
by Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
| | List Price: | $89.95 |  | | Available: | Usually ships in 24 hours | | | | | Sales Rank: | 1082976 | | Studio: | Plenum Press | | | Binding: | Hardcover | | Number Of Pages: | 466 | | Publication Date: | March 31, 1986 | | Publisher: | Plenum Press |
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SIMILAR PRODUCTS |
| | Scanning Electron Microscopy and X-ray Microanalysis
by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, L.C. Sawyer, J.R. Michael
| | Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook
by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters
| | Electron Microscopy and Analysis, Third Edition
by Peter J. Goodhew, John Humphreys, Richard Beanland
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