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| View Larger Image | Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook by Charles E. Lyman, Dale E. Newbury, Joseph Goldstein, David B. Williams, Alton D. Romig Jr., John Armstrong, Patrick Echlin, Charles Fiori, David C. Joy, Eric Lifshin, Klaus-Rüdiger Peters
| | List Price: | $99.00 | | Price: | $79.11 | | You Save: | $19.89 (20%) |  | | Available: | Usually ships in 24 hours |  | |  | | Sales Rank: | 812495 | | Studio: | Springer |  | | Binding: | Spiral-bound | | Number Of Pages: | 420 | | Publication Date: | August 31, 1990 | | Publisher: | Springer |
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SIMILAR PRODUCTS |
| | Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, L.C. Sawyer, J.R. Michael
| | Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
| | Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) by Ludwig Reimer by P.W. Hawkes
| | The Principles and Practice of Electron Microscopy by Ian M. Watt
| | Practical Electron Microscopy: A Beginner's Illustrated Guide by Elaine Evelyn Hunter by Malcolm Silver
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