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| View Larger Image | Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set)
by David B. Williams, C. Barry Carter
| | List Price: | $95.00 | | Price: | $85.50 | | You Save: | $9.50 (10%) |  | | Available: | Usually ships in 24 hours | | | | | Sales Rank: | 260463 | | Studio: | Springer | | | Binding: | Paperback | | Number Of Pages: | 703 | | Publication Date: | August 31, 2004 | | Publisher: | Springer |
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ACCESSORIES |
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EDITORIAL REVIEWS |
Product Description
This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams. |
CUSTOMER REVIEWS (Average Customer Rating: 5.0 based on 6 reviews)
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Grounded in reality 
There are a number of books on TEM, and many are good. However, this book provides a fresh angle for someone learning the subject for the first time because it focuses on what you need to know in order to carry out experiments. Obviously, there is a lot of theory about lenses and scattering. However, there are also dozens of "factoids" such as common lens settings, and most the frequent errors in field emission guns -- and how to handle those errors. My mixing the practical day to day technician's data with the more theoretical underpinning which is my wont, I found it got me up to speed and functional is a very short time. Now experieience with TEMs can carry me the rest of the way.
April 02, 2008 | |
Great book.
Great book and fast delivery.
Book is in very good condition and very good service.
March 31, 2008 | |
Top of the class 
This 4-volume set of paperback books provides a thorough and readable introduction to the science and practice of TEM (transmission electron microscopy). The text is divided into short, digestable sections, each accompanied by figures, graphs and plots. The equations are numerous, but well explained and presented with minimal derivations but full explanations. The books are divided into concise sections making it easy for the reader to find what he/she needs. Overall, a perfect textbook to learn about TEM, and as a reference for those more experienced in this field.
April 27, 2006 | |
Seems like the best TEM book
Good for both beginners and advanced users. Easy to read and well organized. It looks like there are some mistakes in some equations but it is the best TEM book available.
February 25, 2006 | |
Excellent introduction to TEM
In the 70's and 80's the book by Hirsch et al. was the TEM reference tome, and Eddington's book the applications manual.Time has marched on, and this book is the new replacement for both! Carter and Williams wrote a very easy to read, yet well detailed, text and reference for TEM. They cover quite literally everything, in just the right level of detail for 1st or 2nd year grad students. This book is the best way to get a quick grasp of TEM.
March 22, 2002 | |
SIMILAR PRODUCTS |
| | Scanning Electron Microscopy and X-ray Microanalysis
by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, L.C. Sawyer, J.R. Michael
| | Transmission Electron Microscopy and Diffractometry of Materials
by Brent Fultz, James Howe
| | Phase Transformations in Metals and Alloys, Second Edition
by David A. Porter, Kenneth E. Easterling
| | Elements of X-Ray Diffraction (3rd Edition)
by B.D. Cullity, S.R. Stock
| | Solid State Physics
by Neil W. Ashcroft, N. David Mermin
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