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| View Larger Image | Electron Microscopy and Analysis, Third Edition by Peter J. Goodhew, John Humphreys, Richard Beanland
| | List Price: | $59.95 | | Price: | $52.06 | | You Save: | $7.89 (13%) |  | | Available: | Usually ships in 24 hours |  | |  | | Sales Rank: | 190769 | | Studio: | Taylor & Francis |  | | Binding: | Paperback | | Number Of Pages: | 254 | | Publication Date: | November 30, 2000 | | Publisher: | Taylor & Francis |
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EDITORIAL REVIEWS | Product Description Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook. |
SIMILAR PRODUCTS |
| | Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, L.C. Sawyer, J.R. Michael
| | Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM by Ray F. Egerton
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| | Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set) by David B. Williams, C. Barry Carter
| | Introduction to Thermal Analysis: Techniques and Applications (Hot Topics in Thermal Analysis and Calorimetry) by M.E. Brown
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