Science News & Science Current Events
 

View Larger Image

Electron Microscopy and Analysis, Third Edition


by Peter J. Goodhew, John Humphreys, Richard Beanland

List Price: $59.95
Price: $52.06
You Save: $7.89 (13%)
Available: Usually ships in 24 hours
Sales Rank: 190769
Studio: Taylor & Francis
Binding: Paperback
Number Of Pages: 254
Publication Date: November 30, 2000
Publisher: Taylor & Francis


EDITORIAL REVIEWS

Product Description
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.


SIMILAR PRODUCTS

Scanning Electron Microscopy and X-ray Microanalysis
by Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, L.C. Sawyer, J.R. Michael

Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
by Ray F. Egerton

An Introduction to Surface Analysis by XPS and AES
by John F. Watts, John Wolstenholme

Transmission Electron Microscopy: A Textbook for Materials Science (4-Vol Set)
by David B. Williams, C. Barry Carter

Introduction to Thermal Analysis: Techniques and Applications (Hot Topics in Thermal Analysis and Calorimetry)
by M.E. Brown

© 2008 BrightSurf.com