| Light-Element Analysis in the Transmission Electron Microscope: WEDX and EELS (Royal Microscopy Society Microscopy Handbooks, No 16) | Paperbackby P. M. Budd (Author), Peter J. Goodhew (Author)
| List Price: | $14.95 | |
| | Binding: | Paperback | | Publisher: | Oxford University Press, USA | | Edition: | illustrated editionth Edition | | Page Count: | 80 Pages | | Publication Date: | June 09, 1988 | | Sales Rank: | 6,423,588th |
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EDITORIAL REVIEWS | Product Description Emphasizing practical application over theory, this book explains in simple terms the two major techniques by which analysis of very light elements using the transmission electron microscope (TEM) is performed: x-ray analysis without a window (WEDX) and electron energy loss spectroscopy (EELS). Readers familiar with the TEM will quickly learn how to analyse for the light elements (boron, carbon, nitrogen, oxygen, and fluorine). Each technique is first described as it is used for qualitative analysis, and then quantitative analysis is developed. In a final chapter, the two techniques are compared. The book is a practical guide for biologists and for researchers in the medical, physical, and materials sciences. |
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