Science Resources RSS Feeds
|
 |
 |
 |
| View Larger Image | Scanning Electron Microscopy and X-ray Microanalysis | Hardcoverby Joseph Goldstein (Author), Dale E. Newbury (Author), David C. Joy (Author), Charles E. Lyman (Author), Patrick Echlin (Author), Eric Lifshin (Author), L.C. Sawyer (Author), J.R. Michael (Author)
| List Price: | $95.00 | | Price: | $61.29 | | You Save: | $33.71 (35%) | | | Available: | Usually ships in 24 hours |
| | Binding: | Hardcover | | Publisher: | Springer | | Edition: | 3rdrd Edition | | Page Count: | 689 Pages | | Publication Date: | February 01, 2003 | | Sales Rank: | 270,707th |
|
ACCESSORIES |
|
EDITORIAL REVIEWS |
Product Description
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction. SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters. In addition techniques for the elimination of charging in non-conducting specimens are detailed. A data base of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD. This is the third edition of this highly acclaimed text and has been extensively revised. The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities in every corner of the globe. The authors have made extensive changes to the text and figures in this edition as a result of their experience in teaching the various concepts of SEM and x-ray microanalysis. |
CUSTOMER REVIEWS (Average Customer Rating: 5.0 based on 8 reviews)
|
Excellent so far. by TFM3 (Twin Cities, MN)  5 Stars
November 12, 2009
I'm reading this book and an older edition of the Reimer text for in independent study course in SEM. While I'm only three chapters into both texts, the Goldstein text seems more readable. I like the writing style, and it doesn't seem to sacrifice in any technical aspect.
It is also very well illustrated. For a book about an imaging technology, this is obviously quite important. There are many instances where there are sets of images to compare the results achieved with varied operating parameters.
The text is well organized. It begins with an assumption that you know some basic physics and chemistry, but doesn't require any background in microscopy. Both the Table of Contents and Index are detailed enough to enable specific searches for specific subject matter.
This is a textbook I look forward to reading in the evening, and one that I look forward to finishing. It matches very well with the practical work I'm doing on the SEM.
| |
The Bible of All Scanning Electron Microscopy Books by Phillip (Philadephia, PA) 5 Stars
September 20, 2008
If you are like me and had to use a Scanning Electron Microscope or SEM, you want to start with the basics that everyone goes by. This book is a safe bet that most everyone knows about. Plus, it is written with very little background in the world of electron microscopy. Too many authors to list but it's wonderful that alot of experts got together to present this material in clear, concise manner. Before you grab your solid-state physics book or check Wikipedia, just relax and page through it since this book pretty much makes it easy for you.
Chapters are arranged by the following: What is SEM?, How SEM works?, and Why are we interested with SEM? That's the easiest way to explain rather than list all the chapters. If you have a specific question, you don't even have to read through the previous chapters (if you have rough understanding). The size of this book is a BIG PLUS. It's compact compared to the monsterous Transmission Electron Microscopy (TEM) book by Barry Carter which is another great reference. For this price, you would be lucky to find another good reference book under $100 with such relevant information.
| |
Excellent outline of SEM and X-Ray microanalysis by Marcus V. D. Remus (Brazil)  4 Stars
February 25, 2008
This book is a comprehensible review of principles and methods of SEM and X-ray microanalysis write in a single and elegant language. The authors avoid using mathematical formulas in the description and demonstration which turn it an atractive book to all scientists and even the beginners.
| |
Great Book !! by Mr. Badri N. Tiwari (USA) 5 Stars
November 01, 2007
This ought to be the dream book of those who do SEM imaging. The first half or say first five/six chapters are solely devoted to fundamentals of SEMs and the rest of the chapters are dealing generation of X-rays and concentrate on EDS. I have not yet finished reading this book. But certainly recommend to other SEM users to possess this book and read it as and when required.
| |
Book by S. Gergo 5 Stars
October 27, 2007
The book is very good. I can learn a lot about the SEM from this book. The cd has also some interesting pictures, additional information.
| |
SIMILAR PRODUCTS |
| Transmission Electron Microscopy: A Textbook for Materials Science
by David B. Williams (Author), C. Barry Carter (Author)
This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated now in full color throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes...
| 
| Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
by Patrick Echlin (Author)
This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. While the Handbook complements the best-selling textbook, Scanning Electron Microscopy and X-Ray Microanalysis, Third Edition, by Goldstein, et al., it is entirely self-contained...
| 
| Elements of X-Ray Diffraction (3rd Edition)
by B.D. Cullity (Author), S.R. Stock (Author)
Intended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts—Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool...
| 
| Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
by Ludwig Reimer (Author), P.W. Hawkes (Editor)
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
| 
| Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
by Ray F. Egerton (Author)
Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of...
|
|
|
|
