| View Larger Image | Scanning Probe Microscopy (2 vol. set): Electrical and Electromechanical Phenomena at the Nanoscale (v. 1&2) | Hardcoverby Sergei V. Kalinin (Author)
| List Price: | $349.00 | | Price: | $246.15 | | You Save: | $102.85 (29%) | | | Available: | Usually ships in 24 hours |
| | Binding: | Hardcover | | Publisher: | Springer | | Edition: | 1st Edition | | Page Count: | 1,020 Pages | | Publication Date: | December 18, 2006 | | Sales Rank: | 1,794,660st |
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Product Description
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography. |
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