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| View Larger Image | Transmission Electron Microscopy: Physics of Image Formation (Springer Series in Optical Sciences) | Hardcoverby L. Reimer (Author), H. Kohl (Author)
| List Price: | $139.00 | | Price: | $110.66 | | You Save: | $28.34 (20%) | | | Available: | Usually ships in 24 hours |
| | Binding: | Hardcover | | Publisher: | Springer | | Edition: | 5thth Edition | | Page Count: | 590 Pages | | Publication Date: | August 28, 2008 | | Sales Rank: | 978,780th |
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EDITORIAL REVIEWS | Product Description Transmission Electron Microscopy presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray micronanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration corrector, and energy filtering; moreover the new topics of the fourth edition have been updated again. |
SIMILAR PRODUCTS |

| Transmission Electron Microscopy: A Textbook for Materials Science by David B. Williams (Author), C. Barry Carter (Author)
This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated now in full color throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes...
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| Electron Crystallography of Biological Macromolecules by Robert Glaeser (Author), Kenneth Downing (Contributor), David DeRosier (Contributor), Wah Chiu (Contributor), Joachim Frank (Contributor)
This book provides a complete introduction to both the practical details and the theoretical foundations required in order to use electron microscopy as a research tool in structural biology. Planned and written by a group of 5 well-known experts who have pioneered different aspects of the field of electron cryo-microscopy (cryo-EM) of biological macromolecules, this book offers a depth of knowledge and expertise that could only be replicated from the primary literature with great difficulty....
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| Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM by Ray F. Egerton (Author)
Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of...
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| Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein (Author), Dale E. Newbury (Author), David C. Joy (Author), Charles E. Lyman (Author), Patrick Echlin (Author), Eric Lifshin (Author), L.C. Sawyer (Author), J.R. Michael (Author)
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen...
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| Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences) by Ludwig Reimer (Author), P.W. Hawkes (Editor)
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
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