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| View Larger Image | Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis | Hardcoverby Patrick Echlin (Author)
| List Price: | $99.00 | | Price: | $47.68 | | You Save: | $51.32 (52%) | | | Available: | Usually ships in 24 hours |
| | Binding: | Hardcover | | Publisher: | Springer | | Edition: | 1st Edition | | Page Count: | 188 Pages | | Publication Date: | March 19, 2009 | | Sales Rank: | 272,879nd |
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EDITORIAL REVIEWS | Product Description This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzer. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. While the Handbook complements the best-selling textbook, Scanning Electron Microscopy and X-Ray Microanalysis, Third Edition, by Goldstein, et al., it is entirely self-contained and describes what is needed up to the point the sample is put into the instrument. Photomicrographs of each specimen complement the many sample preparation “recipes”. Additional chapters describe the general features of specimen preparation in relation to the different needs of scanning electron microscopes and x-ray microanalyzers, and an appendix covers chemicals and equipment applicable to any of the recipes. This authoritative yet practical Handbook is an essential reference for anyone who uses these instruments, and assumes only an elementary knowledge of preparation techniques to guide the reader through the specific protocols. |
SIMILAR PRODUCTS |

| Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein (Author), Dale E. Newbury (Author), David C. Joy (Author), Charles E. Lyman (Author), Patrick Echlin (Author), Eric Lifshin (Author), L.C. Sawyer (Author), J.R. Michael (Author)
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen...
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Major improvements in instrumentation and specimen preparation have brought SEM to the fore as a biological imaging technique. In FESEM, a field-emission cathode placed in the electron gun of a scanning electron microscope provides narrower probing beams and high electron energy. The result is improved spatial resolution and minimized sample charging and damage. Images produced are less destroyed and have a spatial resolution down to 1.5 nm, three to six times better than conventional SEM....
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Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer. Information presented will enable reader to turn principles into practice Published in association with the Royal Microscopical Society (RMS) -www.rms.org.uk
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This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated now in full color throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes...
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| Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM by Ray F. Egerton (Author)
Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of...
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