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| View Larger Image | Electromigration and Electronic Device Degradation | Hardcoverby Aris Christou (Editor)
| List Price: | $196.50 | | | Available: | Usually ships in 24 hours |
| | Binding: | Hardcover | | Publisher: | Wiley-Interscience | | Page Count: | 343 Pages | | Publication Date: | December 01, 1993 | | Sales Rank: | 2,537,489nd |
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EDITORIAL REVIEWS |
Product Description
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI. |
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