| NANOSCALE CHARACTERIZATION.(atomic resolution )(field ion microscopes)(transmission electron microscopy (TEM)): An article from: Nanoparticle News | Digitalby Business Communications Company, Inc. (Publisher)
| List Price: | $5.95 | | | Available: | Available for download now |
| | Binding: | Digital | | Publisher: | Business Communications Company, Inc. | | Page Count: | 3 Pages | | Publication Date: | September 01, 2004 |
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Product Description
This digital document is an article from Nanoparticle News, published by Business Communications Company, Inc. on September 1, 2004. The length of the article is 776 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.Citation DetailsTitle: NANOSCALE CHARACTERIZATION.(atomic resolution )(field ion microscopes)(transmission electron microscopy (TEM))Publication: Nanoparticle News (Magazine/Journal)Date: September 1, 2004Publisher: Business Communications Company, Inc.Volume: 7 Issue: 8 Page: NADistributed by Thomson Gale |
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