| Characterization challenges increase at the nanoscale. (Commentary).(probe tip of an atomic force microscope): An article from: Nanoparticle News | Digitalby Mindy N. Rittner (Author)
| List Price: | $5.95 | | | Available: | Available for download now |
| | Binding: | Digital | | Publisher: | Business Communications Company, Inc. | | Page Count: | 2 Pages | | Publication Date: | May 01, 2003 |
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Product Description
This digital document is an article from Nanoparticle News, published by Business Communications Company, Inc. on May 1, 2003. The length of the article is 599 words. The page length shown above is based on a typical 300-word page. The article is delivered in HTML format and is available in your Amazon.com Digital Locker immediately after purchase. You can view it with any web browser.Citation DetailsTitle: Characterization challenges increase at the nanoscale. (Commentary).(probe tip of an atomic force microscope)Author: Mindy N. RittnerPublication: Nanoparticle News (Magazine/Journal)Date: May 1, 2003Publisher: Business Communications Company, Inc.Volume: 6 Issue: 4 Page: 13(1)Distributed by Thomson Gale |
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