Tough new probe developed for nanotechnologists
Since the invention of the atomic force microscope (AFM) in 1986 by Nobel laureate Gerd Binnig, the tool has been employed to advance the science of materials in many ways, from nanopatterning (dip-pen nanolithography) to the imaging of surfaces and nano-objects such as carbon nanotubes, DNA, proteins and cells. In all these applications, the quality and integrity of the tip used to obtain the images or interrogate materials is paramount.