UB Engineers Prove That Carbon Nanotubes Are Superior to Metals for Electronics In the quest to pack ever-smaller electronic devices more densely with integrated circuits, nanotechnology researchers keep running up against some unpleasant truths: higher current density induces electromigration and thermomigration, phenomena that damage metal conductors and produce heat, which leads to premature failure of devices. view more (2009-03-23)
NIST develops test method for key micromechanical property Engineers and researchers designing and building new microelectromechanical systems (MEMS) can benefit from a new test method developed at the National Institute of Standards and Technology (NIST) to measure a key mechanical property of such systems: elasticity. view more (2008-01-10)
