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Enhanced CsPbBr3 x-ray detectors achieve record-low detection limits

04.29.25 | Hefei Institutes of Physical Science, Chinese Academy of Sciences

In a major step forward for radiation detection, a research team led by Prof. MENG Gang has significantly enhanced the performance of CsPbBr 3 -based X-ray detectors by dramatically lowering their detection limit and suppressing noise and ion migration through innovative cooling and defect-passivation strategies.

Their work, published in Applied Physics Letters and Advanced Functional Materials , lays the groundwork for the next generation of safer and more precise X-ray imaging technology.

One of the main challenges in utilizing CsPbBr 3 for X-ray detectors has been minimizing noise and improving sensitivity.

To address this, the team applied a liquid nitrogen cooling technique to CsPbBr 3 single crystals, effectively eliminating deep-level defects that typically introduce noise. This approach boosted the material’s resistivity by two orders of magnitude and reduced the detection limit to 0.054 nGy air ·s⁻¹, enabling the detection of extremely weak X-ray signals.

The team also tackled the issue of ion migration in polycrystalline CsPbBr 3 wafers, which are more practical for large-scale applications. In collaboration with Prof. Fang Xiaosheng's group from Fudan University, they developed a grain boundary passivation method that raised the ion migration activation energy to 0.56 eV. This significantly suppressed dark current drift under high electric fields, allowing the polycrystalline detector to reach a detection limit of 9.41 nGy air ·s⁻¹ while maintaining excellent image contrast.

CsPbBr 3 detectors could dramatically reduce the radiation dose required for X-ray imaging, which is particularly important for vulnerable populations, such as children and pregnant women. This advancement not only offers a clearer path toward next-generation X-ray detectors but also accelerates the evolution of radiation imaging technology toward greater safety and precision.

Advanced Functional Materials

2-Bromonaphthalene-Induced Defect Passivation to Suppress Ion Migration in CsPbBr3 Wafer for X-Ray Detector with Bias-Resistant Stability

17-Mar-2025

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Weiwei Zhao
Hefei Institutes of Physical Science, Chinese Academy of Sciences
annyzhao@ipp.ac.cn

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This article is based on a news release from Hefei Institutes of Physical Science, Chinese Academy of Sciences. BrightSurf curates and republishes science news from research institutions worldwide; the original release is linked below.

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APA:
Hefei Institutes of Physical Science, Chinese Academy of Sciences. (2025, April 29). Enhanced CsPbBr3 x-ray detectors achieve record-low detection limits. Brightsurf News. https://www.brightsurf.com/news/1EOD94QL/enhanced-cspbbr3-x-ray-detectors-achieve-record-low-detection-limits.html
MLA:
"Enhanced CsPbBr3 x-ray detectors achieve record-low detection limits." Brightsurf News, Apr. 29 2025, https://www.brightsurf.com/news/1EOD94QL/enhanced-cspbbr3-x-ray-detectors-achieve-record-low-detection-limits.html.