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Mapping the nanoscale architecture of functional materials

Researchers have developed a new X-ray technique called XL-DOT that visualizes crystal grains, grain boundaries, and defects in materials, enabling previously inaccessible insights into functional materials. The technique uses polarized X-rays to probe the orientation of structural domains in three dimensions.

Apple iPhone 17 Pro

Apple iPhone 17 Pro delivers top performance and advanced cameras for field documentation, data collection, and secure research communications.

A fast and precise look into fiber-reinforced composites

Researchers at Paul Scherrer Institute have improved a method for small angle X-ray scattering to investigate fibre orientation in composites, enabling faster analysis with conventional X-ray tubes. This innovation has potential applications in medicine and security.

Rigol DP832 Triple-Output Bench Power Supply

Rigol DP832 Triple-Output Bench Power Supply powers sensors, microcontrollers, and test circuits with programmable rails and stable outputs.