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Mapping the nanoscale architecture of functional materials

Researchers have developed a new X-ray technique called XL-DOT that visualizes crystal grains, grain boundaries, and defects in materials, enabling previously inaccessible insights into functional materials. The technique uses polarized X-rays to probe the orientation of structural domains in three dimensions.

SourcePaul Scherrer Institute·JournalNature·TypeExperimental study·DateDec 11, 2024
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A fast and precise look into fiber-reinforced composites

Researchers at Paul Scherrer Institute have improved a method for small angle X-ray scattering to investigate fibre orientation in composites, enabling faster analysis with conventional X-ray tubes. This innovation has potential applications in medicine and security.

SourcePaul Scherrer Institute·JournalNature Communications·DateNov 12, 2019