Articles tagged with Manufacturing Industry
A software tool developed at Oak Ridge National Laboratory helps identify manufacturing problems causing defects in silicon wafers, increasing productivity and reducing costs for the US semiconductor industry. The 'spatial signature analysis' algorithm has been licensed to 14 manufacturers and equipment suppliers.
A new software program, EXAKT, uses mathematical models to determine the optimal time to replace or repair equipment based on performance data and economic factors. This allows maintenance managers to combine risk assessment and economic considerations in making informed decisions.
Pacific Northwest National Laboratory has been awarded $2.1 million for three projects that could lead to new disease identification methods, improved glass production, and faster semiconductor devices. The funding is part of a larger DOE initiative with industry partners IBM, Corning, SEMATECH, and Genometrix.
Sandia National Laboratories has released a CD-ROM containing over 60 megabytes of data gathered from downhole diagnostic tools used in 80% of domestic oil wells. The new tool provides valuable information about well bore dynamics and mechanical stresses on sucker rod strings, leading to equipment fatigue and rod failure.
Cornell University is developing a PICT capable of attaching integrated circuits with at least 10 times more connections than today's most powerful chips. The goal is to meet technology goals for microprocessors with 5,400 connections by 2009 and 7,300 connections by 2012.
Researchers at Purdue University have developed a process to make topsoil from coal ash, yard waste and industrial byproducts. The resulting soil is nutrient-rich and outperforms local topsoil in terms of yield.
The Unified Data Meta Model (UDMM) integrates CAD, CAPP, and MRP systems to enable efficient data transfer between them, reducing production time and costs. This integration allows industrial engineers to work more efficiently throughout the manufacturing process.
A new virtual housewares catalog technology developed at Stanford University allows users to compare and purchase housewares online. The Infomaster system links online catalogs from various manufacturers, enabling searches for equivalent products despite different terms.
A flaw detection system developed by the Department of Energy's Oak Ridge National Laboratory is helping textile plants in the U.S. improve fabric quality and reduce defects, which could lead to cost savings and job preservation.