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Science News for March 11, 2004


Delving into defects spurs prospects for chip insulator

A team of NIST and IBM researchers has quantified 'electrical capture defects' in hafnium oxide chips, which can drain currents and hinder transistor operation. By applying a voltage pulse and measuring current, the scientists identified critical locations where these defects occur near the silicon substrate-hafnium oxide interface.

SourceNational Institute of Standards and Technology (NIST)·JournalIEEE Electron Device Letters·DateMar 11, 2004

'Before and after' diet ads promote bias against overweight people

Researchers found that subjects viewing 'before and after' ads indicated a strong anti-fat bias and believed weight is more easily controllable than those who viewed only the 'before' or 'after' pictures. The study suggests that such biases can influence further weight and eating disorder psychopathology.

SourceUniversity of Pennsylvania·JournalEating and Weight Disorders - Studies on Anorexia Bulimia and Obesity·DateMar 11, 2004