Add BrightSurf on Google Email

National Institute of Standards and Technology (NIST)


Probing and controlling 'molecular rattling' may mean better preservatives

Scientists at NIST developed a measurement method to quantify the slowing down of molecular rattling in preservative formulations. The team discovered a general pattern of behavior that applies to various materials, promising better preservation and extended shelf life for vaccines, food, and other biological materials.

SourceNational Institute of Standards and Technology (NIST)·JournalThe Journal of Physical Chemistry B·DateFeb 25, 2009

Toothsome research: Deducing the diet of a prehistoric hominid

Researchers used finite element analysis to determine the forces and stresses involved in chewing food, contradicting previous classical analyses. The study suggests that Australopithecus africanus may have eaten larger hard objects, such as nuts, due to their fracture properties rather than wear patterns.

SourceNational Institute of Standards and Technology (NIST)·JournalProceedings of the National Academy of Sciences·DateFeb 11, 2009

Long-sought protein structure may help reveal how 'gene switch' works

Researchers at NIST and Brookhaven National Laboratory have defined the structure of a metabolic switch found inside most types of bacteria, revealing how a key protein regulates genes involved in bacterial survival. The discovery could lead to new methods for preventing tuberculosis and other pathogenic diseases.

SourceNational Institute of Standards and Technology (NIST)·JournalJournal of Biological Chemistry·DateFeb 6, 2009

Insights into polymer film instability could aid high tech industries

A team of scientists at NIST discovered that temperature can influence the competing processes of crystallization and dewetting in polymer films. This understanding could lead to better control of these processes, resulting in more stable and uniform films for applications like organic solar cells. The research also has implications fo...

Cracking a tough nut for the semiconductor industry

Researchers at NIST have developed a new technique to measure the toughness of thin insulating films used in high-performance integrated circuits. This breakthrough could help improve the reliability and manufacturability of ICs by identifying films with brittle fracture failure, affecting both manufacturing yields and device reliability.

SourceNational Institute of Standards and Technology (NIST)·JournalJournal of Materials Research·DateDec 23, 2008

NIST 'stress tests' probe nanoscale strains in materials

Researchers at NIST have demonstrated a way to measure low levels of stress in semiconductor devices as small as 10 nanometers across. By combining two techniques - electron back scattered diffraction and confocal Raman microscopy - they resolved the long-standing disagreement between two widely used methods of stress measurement.

SourceNational Institute of Standards and Technology (NIST)·JournalApplied Physics Letters·DateNov 25, 2008