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National Institute of Standards and Technology (NIST)


Rough times: NIST's new approach to surface profiling

Researchers at NIST have developed a novel technique for measuring surface roughness, which could lead to more accurate models of deformation and lower tooling costs. The new method uses data from a scanning laser confocal microscope and challenges the traditional linear relationship between surface roughness and material deformation.

SourceNational Institute of Standards and Technology (NIST)·JournalMaterials Science and Technology·DateJan 9, 2008

Ginkgo SRMs: Tools for product analysis/quality

The National Institute of Standards and Technology (NIST) has issued a suite of Standard Reference Materials (SRMs) for ginkgo biloba, enabling the validation of analytical methods and support measurements associated with clinical trials or product label claims. The SRMs can also be used by dietary supplement manufacturers to improve p...

SourceNational Institute of Standards and Technology (NIST)·JournalAnalytical and Bioanalytical Chemistry·DateAug 16, 2007

Electronic 'crowd behavior' revealed in semiconductors

Researchers at JILA discovered a previously unseen type of collective electronic behavior in semiconductors, shedding light on interactions between microscopic particles. The study used ultrafast lasers to analyze the phase shift of light, confirming the importance of collective exciton behavior and its superiority over simpler models.

SourceNational Institute of Standards and Technology (NIST)·JournalProceedings of the National Academy of Sciences·DateJul 6, 2007