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The Gwangju Institute of Science and Technology study examines thin film surface symmetries

Researchers at GIST develop a non-contact, nondestructive approach to characterize crystal structures in thin films, shedding light on surface symmetries in SrRuO3. The technique offers a platform for structural characterization of surfaces and interfaces using optical techniques.

SourceGIST (Gwangju Institute of Science and Technology)·JournalApplied Surface Science·TypeExperimental study·DateAug 11, 2021