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Search results for “Metrology”

355 results for "Metrology"

Bringing angular momentum to holograms and metasurfaces

Researchers develop unique method for applying angular momentum holography for information multiplexing, enabling unprecedented capacity for optical information processing. The new paradigm allows for spatially modulating waveforms and offers additional security locks, revolutionizing existing optical encryption schemes.

Researchers succeeded in developing a light source that produced two entangled light beams

Scientists successfully created a light source that produced two entangled light beams using rubidium atoms. The entanglement was achieved by adding new detection steps to measure the quantum correlations in the amplitudes and phases of the fields generated, enabling applications in quantum computing, encryption, and metrology.

Observation of mechanical bound states in the continuum in an optomechanical microresonator

Scientists have demonstrated mechanical bound states in the continuum (BICs) in an individual optomechanical microresonator, reducing energy dissipation and enhancing performance. BICs exist for a wide range of supporting structure geometries, enabling versatile applications in micro/nanoelectromechanical systems.

Common path principle improves shape metrology of complex precision optics

A new common path interferometer combining Fizeau and Twyman-Green principles has been developed to measure complex precision optics with improved accuracy. The Tilted Wave Interferometer overcomes reference wave problems, enhancing flexibility and reducing measurement time.

New software platform advances understanding of the surface finish of manufactured components

Scientists developed a software platform to analyze surfaces, creating digital twins that predict material properties like adhesion and durability. The contact.engineering platform standardizes procedure and facilitates open science, allowing users to share measurements and collaborate.

SourceUniversity of Pittsburgh·JournalSurface Topography Metrology and Properties·TypeComputational simulation/modeling·DateSep 19, 2022

Combing light with sharper teeth

The study reveals that noise sources in the micro resonator can cause the lines to be narrower than previously thought, enabling more precise measurements. By understanding this phenomenon, researchers can develop even more accurate devices, such as instruments measuring signals at light-years distances.

SourceChalmers University of Technology·JournalNature Communications·TypeExperimental study·DateSep 1, 2022

Advances in the design and manufacturing of novel freeform optics

Freeform optics have revolutionized the way we approach precision optical systems, enabling superior imaging in compact packages. Researchers have summarized the present state of art in advances, design methods, manufacturing, metrology, and applications. Key challenges include standard definitions, optimization complexities, and measu...

SourceInternational Journal of Extreme Manufacturing·JournalInternational Journal of Extreme Manufacturing·DateJul 7, 2022

Diamonds are for quantum sensing

A team of researchers at the University of Tsukuba has developed a new method for measuring tiny changes in magnetic fields using nitrogen-vacancy defects in diamonds. This breakthrough could lead to more accurate quantum sensors and spintronic computers, enabling precise monitoring of temperature, magnetic, and electric fields.

SourceUniversity of Tsukuba·JournalAPL Photonics·DateJun 16, 2022

A fast and accurate innovative imaging technique to monitor modern semiconductor devices

Researchers at Samsung have developed a novel approach to inspect critical dimensions of semiconductor devices, improving speed and resolution. The new 'line-scan hyperspectral imaging' (LHSI) technique offers faster measurements with high spatial resolution, outperforming existing methods.

SourceSPIE--International Society for Optics and Photonics·JournalJournal of Micro/Nanopatterning Materials and Metrology·DateApr 21, 2022

Quantum sensors: Measuring even more precisely

Physicists at the University of Innsbruck have developed a programmable quantum sensor that can measure with even greater precision, using tailored entanglement to optimize performance. The sensor autonomously finds its optimal settings through free parameters, promising a significant advantage over classical computers.

SourceUniversity of Innsbruck·JournalNature·TypeExperimental study·DateMar 23, 2022

Ln-doped lead-free double perovskite based ultra-broadband LED

Researchers have developed a lead-free ultra-broadband LED using lanthanide-doped double perovskites, offering improved stability and cost-effectiveness. The device shows promising applications in spectroscopic analysis and multifunctional lighting, outperforming previously reported ultrabroadband light sources.

INRiM demonstrates a new technique for improving long-distance quantum key distribution in a real field

Researchers at INRIM demonstrate a novel method for enhancing long-distance quantum key distribution by leveraging coherent laser interferometry, single-photon technologies, and quantum metrology. This breakthrough enables lower error rates and increased message length, paving the way for more efficient QKD protocols.

SourceINRIM - Istituto Nazionale di Ricerca Metrologica·JournalNature Communications·DateJan 20, 2022

Light vs. data: Backpropagation advancing optical metrology and inverse design process

A new technique using thin-film neural networks (TFNNs) improves processing times for all-optical neural networks and enables fast optimization of photonic devices. The approach accelerates the design and fabrication of multilayer thin films, mimicking human retina cells.

Photonic-dispersion neural networks for inverse scattering problems

Researchers developed a high-throughput Fourier-optics-based angle-resolved imaging spectroscopy system with robust neural network-based algorithms to solve inverse scattering problems. The system achieved a strong linear correlation between the reconstructed geometric parameters and atomic force microscopy measurements.

High-precision frequency measurement

Researchers at ETH Zurich and partners have demonstrated a method to send precise reference frequencies via conventional telecommunications infrastructure, enabling chemical spectroscopy analyses that are 100 times more accurate than before. The approach uses the L band frequency, which is less congested by data traffic, allowing for h...

SourceETH Zurich·JournalOptics Express·TypeExperimental study·DateJul 29, 2021

Observing quantum coherence from photons scattered in free-space

Scientists have successfully transferred and recovered quantum coherence from photons scattered in free-space for the first time, paving the way for new applications in quantum communication, imaging, and sensing. The novel technique uses custom hardware to maintain coherence even after scattering from a diffuse surface.

Direct observation of the ad- and desorption of guest atoms into a mesoporous host

Scientists have developed a new method to directly observe the filling and emptying of tiny pores in materials, revealing complex mechanisms behind guest-atom interactions. This breakthrough uses combined X-ray methods to provide empirical insights into confined matter in battery electrodes, catalysts, and hydrogen storage materials.

SourceHelmholtz-Zentrum Berlin für Materialien und Energie·JournalThe Journal of Physical Chemistry Letters·DateApr 21, 2021

Twistoptics--A new way to control optical nonlinearity

Researchers at Columbia University School of Engineering and Applied Science have developed a new technique to control optical nonlinearity in 2D materials. The twistoptics approach enables giant nonlinear optical responses in small volumes, leading to compact laser systems and potential applications in quantum computing, spectroscopy,...

Angstrom multilayer metrology by combining spectral measurements and machine learning

Researchers have developed a new method to accurately characterize the thickness of hundreds-layer semiconductor devices using optical spectral measurements and machine learning. The technique can determine layer thickness with an average error of 1.6 Å, helping control etching and deposition processes.